2

HOT-CARRIER RELIABILITY IN n-MOSFETs USED AS PASS-TRANSISTORS

Year:
1998
Language:
english
File:
PDF, 259 KB
english, 1998
3

French Permitted Explosives

Year:
1986
Language:
english
File:
PDF, 514 KB
english, 1986
4

Hot-carrier injections in SiO2

Year:
1998
Language:
english
File:
PDF, 473 KB
english, 1998
7

The metal/organic monolayer interface in molecular electronic devices

Year:
2003
Language:
english
File:
PDF, 513 KB
english, 2003
8

Electronic properties of organic monolayers and molecular devices

Year:
2006
Language:
english
File:
PDF, 1.08 MB
english, 2006
9

Electron traps created in gate oxides by Fowler–Nordheim injections

Year:
1998
Language:
english
File:
PDF, 142 KB
english, 1998
25

Contribution a la psychophysiologie de l'élevage des Reines chez les Abeilles (I)

Year:
1957
Language:
french
File:
PDF, 2.53 MB
french, 1957
26

L'importance de l'approvisionnement en eau dans la ruche

Year:
1957
Language:
french
File:
PDF, 634 KB
french, 1957
38

near-interface states

Year:
1988
Language:
english
File:
PDF, 466 KB
english, 1988
39

structures characterized by tunnel emission with deep-level transient spectroscopy

Year:
1986
Language:
english
File:
PDF, 1.13 MB
english, 1986
40

Profiling of defects using deep level transient spectroscopy

Year:
1986
Language:
english
File:
PDF, 708 KB
english, 1986